GOST R 71422-2024. The epitaxial structures and dielectric films. Method for measuring the thickness of gallium arsenide epitaxial layers based on a spherical section
In stock
Product details
Document Number
GOST R 71422-2024
Title
The epitaxial structures and dielectric films. Method for measuring the thickness of gallium arsenide epitaxial layers based on a spherical section
Document status
Active, Most Current
Pages count
12
View all details
Product details
|
Document Number
|
GOST R 71422-2024 |
|
Title
|
The epitaxial structures and dielectric films. Method for measuring the thickness of gallium arsenide epitaxial layers based on a spherical section |
|
Document status
|
Active, Most Current |
|
Pages count
|
12 |
|
Published
|
01.03.2025 |
|
Delivery time
|
3 business days |
|
Format
|
Electronic (pdf/doc) |
|
Delivery
|
download |
|
ICS
|
33.060.99 |
|
SKU
|
87180 |