GOST R 8.716-2010. State system for ensuring the uniformity of measurements. Reflectometers of the extreme ultraviolet radiation for measurements of the characteristics of multilayer nanostructures in the wavelength range 10 to 30 nm. Procedure of measurements
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Product details
Document Number
GOST R 8.716-2010
Title
State system for ensuring the uniformity of measurements. Reflectometers of the extreme ultraviolet radiation for measurements of the characteristics of multilayer nanostructures in the wavelength range 10 to 30 nm. Procedure of measurements
Document status
Active, Most Current
Pages count
12
View all details
Product details
|
Document Number
|
GOST R 8.716-2010 |
|
Title
|
State system for ensuring the uniformity of measurements. Reflectometers of the extreme ultraviolet radiation for measurements of the characteristics of multilayer nanostructures in the wavelength range 10 to 30 nm. Procedure of measurements |
|
Document status
|
Active, Most Current |
|
Pages count
|
12 |
|
Published
|
01.01.2012 |
|
Delivery time
|
3 business days |
|
Format
|
Electronic (pdf/doc) |
|
Delivery
|
download |
|
ICS
|
17.020 |
|
SKU
|
53098 |